Low-Frequency 1/f Noise Characteristics of Ultra-Thin AlOx-Based Resistive Switching Memory Devices with Magneto-Resistive Responses.
Author: Hong, Jhen-Yong; Chen, Chun-Yen; Ling, Dah-Chin; Martínez, Isidoro; González-Ruano, César; Aliev, Farkhad G.
Abstract: Low-frequency 1/f voltage noise has been employed to probe stochastic charge dynamics
in AlOx-based non-volatile resistive memory devices exhibiting both resistive switching (RS) and
magneto-resistive (MR) effects. A 1/f
noise power spectral density is observed in a wide range
of applied voltage biases. By analyzing the experimental data within the framework of Hooge’s
empirical relation, we found that the Hooge’s parameter and the exponent
exhibit a distinct
variation upon the resistance transition from the low resistance state (LRS) to the high resistance
state (HRS), providing strong evidence that the electron trapping/de-trapping process, along with
the electric field-driven oxygen vacancy migration in the AlOx barrier, plays an essential role in the
charge transport dynamics of AlOx-based RS memory devices.
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